Measurement Infrastructure for Optimization and Characterization of Microwave Transistor Devices
نویسندگان
چکیده
various techniques and methods have evolved recently for the characterization and measurement of microwave devices. Waveform measurement and engineering system among them is a very promising candidate for the optimization and characterization of transistor device for use in power amplifier design. This paper presents an all encompassing waveform measurement and engineering system which is capable of providing accurate characterization data for the purpose of optimizing the device. The waveform measurement is achieved by applying enhanced calibration algorithm around an MTA based setup. The capability to engineer the waveforms is achieved by an emerging active load pull approach called ‘Envelope Load Pull’.
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